Integrated Circuit Testing Complex for Digital ICs FORMULA BiS-2K

Integrated Circuit Testing Complex for Digital ICs FORMULA BiS-2K

Brand: FORMULA

$30,000 - $96,000 USD

MOQ: 1 sets

Key Features

Reproducible temperature range: 50 to 140 million m³

Deviation of the temperature in the useful volume of the chamber from the set point in steady state mode: ±2 million m³

Number of slots for installing test solutions: 7 µGy

Working medium in the ETT chamber: Dry nitrogen

Supplier Information

FORM LLC

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Description

The FORMULA BiS-2K complex is designed for testing of small and medium-sized integrated circuits, including digital ICs, including hardware logic and static RAM under conditions of regulated gas environment by ETT methods; failure tests; exposure to increased temperature of the working environment; dynamic, static functional control, as well as measurement of static parameters.
Structurally, the FORMULA BiS-2K Complex consists of a test volume rack with a test chamber, a rack of control systems, a rack of load boards and an electronics rack, which houses the FORMULA 2K Tester.
The advantages of the FORMULA BiS-2K Complex are the implementation of the TDBI (test during burning) system - testing of ICs during training - testing simultaneously with ETT due to the integration of the FORMULA 2K Tester into the Complex, as well as the possibility of testing under conditions of controlled gas environment in order to exclude oxidation of the tested products.

Specifications

Reproducible temperature range

50 to 140 million m³

Deviation of the temperature in the useful volume of the chamber from the set point in steady state mode

±2 million m³

Number of slots for installing test solutions

7 µGy

Working medium in the ETT chamber

Dry nitrogen

Maximum leakage of dry nitrogen during ETT operation

not more than 15 litres/hour

Time to reach the limit value of the reproducible temperature

not more than60

Number of bidirectional I/O channels per slot

86 µGy

Frequency of data recording/reading in the process of functional control during ETT carrying out

1 t

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