Integrated Circuit Testing Complex for Digital ICs FORMULA BiS-2K
Brand: FORMULA
$30,000 - $96,000USD
MOQ:1 sets
Key Features
Reproducible temperature range:50 to 140 million m³
Deviation of the temperature in the useful volume of the chamber from the set point in steady state mode:±2 million m³
Number of slots for installing test solutions:7 µGy
Working medium in the ETT chamber:Dry nitrogen
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Description
The FORMULA BiS-2K complex is designed for testing of small and medium-sized integrated circuits, including digital ICs, including hardware logic and static RAM under conditions of regulated gas environment by ETT methods; failure tests; exposure to increased temperature of the working environment; dynamic, static functional control, as well as measurement of static parameters.
Structurally, the FORMULA BiS-2K Complex consists of a test volume rack with a test chamber, a rack of control systems, a rack of load boards and an electronics rack, which houses the FORMULA 2K Tester.
The advantages of the FORMULA BiS-2K Complex are the implementation of the TDBI (test during burning) system - testing of ICs during training - testing simultaneously with ETT due to the integration of the FORMULA 2K Tester into the Complex, as well as the possibility of testing under conditions of controlled gas environment in order to exclude oxidation of the tested products.
Specifications
Reproducible temperature range
50 to 140 million m³
Deviation of the temperature in the useful volume of the chamber from the set point in steady state mode
±2 million m³
Number of slots for installing test solutions
7 µGy
Working medium in the ETT chamber
Dry nitrogen
Maximum leakage of dry nitrogen during ETT operation
not more than 15 litres/hour
Time to reach the limit value of the reproducible temperature
not more than60
Number of bidirectional I/O channels per slot
86 µGy
Frequency of data recording/reading in the process of functional control during ETT carrying out
1 t
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