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Integrated Circuit Testing Complex for Digital ICs FORMULA BiS-2K

Integrated Circuit Testing Complex for Digital ICs FORMULA BiS-2K — FORM LLC

品牌: FORMULA
¥216,000 - ¥691,200 CNY
MOQ: 1 sets

主要特点

Reproducible temperature range: 从 50 到 140 °C
Deviation of the temperature in the useful volume of the chamber from the set point in steady state mode: ±2 °C
Number of slots for installing test solutions: 7 pcs
Working medium in the ETT chamber: 干氮

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产品描述

The FORMULA BiS-2K complex is designed for testing of small and medium-sized integrated circuits, including digital ICs, including hardware logic and static RAM under conditions of regulated gas environment by ETT methods; failure tests; exposure to increased temperature of the working environment; dynamic, static functional control, as well as measurement of static parameters.

Structurally, the FORMULA BiS-2K Complex consists of a test volume rack with a test chamber, a rack of control systems, a rack of load boards and an electronics rack, which houses the FORMULA 2K Tester.

The advantages of the FORMULA BiS-2K Complex are the implementation of the TDBI (test during burning) system - testing of ICs during training - testing simultaneously with ETT due to the integration of the FORMULA 2K Tester into the Complex, as well as the possibility of testing under conditions of controlled gas environment in order to exclude oxidation of the tested products.

规格参数

Reproducible temperature range
从 50 到 140 °C
Deviation of the temperature in the useful volume of the chamber from the set point in steady state mode
±2 °C
Number of slots for installing test solutions
7 pcs
Working medium in the ETT chamber
干氮
Maximum leakage of dry nitrogen during ETT operation
不超过 15 升/小时
Time to reach the limit value of the reproducible temperature
不超过 60
Number of bidirectional I/O channels per slot
86 pcs
Frequency of data recording/reading in the process of functional control during ETT carrying out
1

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