Universal Measurement Systems for Plate Parameters IUS-7P

Universal Measurement Systems for Plate Parameters IUS-7P

Brand: Ostec

$1,500 - $4,800 USD

MOQ: 2 units

Key Features

Assignment: Designed for measuring specific surface electrical resistance by the four-probe method (Kelvin method).

Type: WAFER MEASUREMENT SYSTEM

Model: IUS-7R

Supplier Information

OSTEK-ELEKTRO LLC

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Description

Features:Measurements by four-probe method (Kelvin method) of specific and surface resistivity of semiconductor or metal samples up to 300 mm in diameter.Universal source-measurer (included in the State Register of measuring instruments of the Russian Federation).Software "Crystal" for automatic calculation of specific and surface resistivity taking into account the size of the sample according to ASTM F84-99 standard, developed by Ostek-Elektro Ltd.Measuring range from 1 µOhm/ to 100 MOhm/ for surface resistivity, from 1 µOhm to 1 MOhm/ for resistivity.Measuring accuracy - not worse than 0,3 %.Accessories:temperature table up to +300 oC;table with vacuum clamp (for measuring samples 6048);shielding chamber.

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