Surface Roughness Measuring Device "SEITRONIC PSH8

Surface Roughness Measuring Device "SEITRONIC PSH8

Brand: SEYTRONIK

$600 - $1,800 USD

MOQ: 5 pieces

Key Features

Measured roughness parameters SEITRONIC PS8-3(S.S.): Ra; Rz; Rmax; Sm; tp; S; Rp; Rv; Rq; ?q; ?a; Lo; lo; D; ?q; ?a

Principle of action: Contact

Maximum length of the assessment L: 12.5 mm

Number of step cutoffs N in the estimation length: 1; 3; 5

Supplier Information

Pipeline Systems Plant LLC

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Description

The device is designed for measuring roughness of surfaces, the cross-section of which in the measurement plane is a straight line (cylindrical surfaces; holes; flat surfaces). Measurement of roughness parameters is performed according to the system of the middle line (GOST 25142-82) in accordance with the nomenclature and ratios of parameter values provided by GOST 2789-73.

SEITRONIK PSh8-3(S.S.) - measurement of roughness of parts surfaces and analysis of parts processing quality by all standardised roughness parameters. Scope of application - shops and laboratories of industrial enterprises of various branches of mechanical engineering, research institutes, metrology centres, as well as in field conditions.

The device is included in the register of measuring instruments.

Specifications

Measured roughness parameters SEITRONIC PS8-3(S.S.)

Ra; Rz; Rmax; Sm; tp; S; Rp; Rv; Rq; ?q; ?a; Lo; lo; D; ?q; ?a

Principle of action

Contact

Maximum length of the assessment L

12.5 mm

Number of step cutoffs N in the estimation length

1; 3; 5

Values of step l cutoffs for each subrange of the measured parameter, respectively

0,25; 0,8; 2,5 mm

Discreteness of reference, µm

0.01

Basic relative error tolerance limit for parameters Ra, Rz, Rmax, %

±5 set

Measured hole depth max.

20 mm

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