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Measurement Stand for Microelectronic Components FT-17DT-256

Measurement Stand for Microelectronic Components FT-17DT-256

Brand: SOVTEST ATE
$9,000 - $36,000 USD
MOQ: 1 pieces

Key Features

Maximum performance of functional control: 800 Mbps
Maximum number of channels: Polyvinyl chloride plasticate, halogen-free composition µGy
Overall dimensions (W×H×H): 595x696x360
Vector memory capacity per channel: 128 (256) Mb

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Description

The measuring bench for control of parameters of microelectronic components FT-17DT-256, is designed for parametric, dynamic and functional control of digital and digital-analogue microcircuits with the performance of functional control up to 800Mbps.
The bench is an automated multichannel equipment. The parameters are controlled by applying signals to the pins of the chip under test, measuring the response signals and comparing them with the expected values.
Up to 4 boards of channel electronics with a total number of channels up to 256 can be installed in the stand.

Specifications

Maximum performance of functional control
800 Mbps
Maximum number of channels
Polyvinyl chloride plasticate, halogen-free composition µGy
Overall dimensions (W×H×H)
595x696x360
Vector memory capacity per channel
128 (256) Mb
Integration with probe dispensers, test equipment, external instruments via interfaces
Armoured glass
Number of high-voltage sources-meters of static parameters
32 µGy
Reproducible/measurable current by high voltage static meter
0...0.08
Reproducible/measurable voltage with a high-voltage static meter
-4...12.5 thousand m³
Number of sources-meters of static parameters
Polyvinyl chloride plasticate, halogen-free composition µGy
Reproducible/measurable current by the static meter
0...0.032
Reproducible/measurable voltage of the static meter
-1.5...6 thousand m³
Voltage setting error of the measuring power source
-0.1...0.1 set
Load capacity of the measurement power supply
1.2
Reproducible voltage by the measuring power supply
-5.5...14.5 thousand m³
Driver/comparator voltage reproduction/measurement error
-0.015...0.015 thousand m³
Reproducible/measurable voltage by driver/comparator
-1.5...6 thousand m³
Maximum number of simultaneously controlled microchips
96 µGy
Maximum number of channel electronics boards
4 µGy
Mode of operation
prolonged
Weight
45

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