NTEGRA PRIMA Atomic Force Microscope for Advanced Measurement Techniques — NT-MDT LLC

Name: NTEGRA PRIMA Atomic Force Microscope for Advanced Measurement Techniques
Brand: NTEGRA
SKU: 145213
Availability: InStock

Brand: NTEGRA

$36,000 - $120,000 USD

MOQ: 1 pieces

Key Features

XY scanning range, µm: 100x100; 2x2

Scanning mode: Contact AFM; Semi-contact AFM; Jumping AFM; Scanning capacitance microscopy; Kelvin probe microscopy; Magnetic force microscopy; Electrostatic force microscopy

dimensions: 400x250x450 mm

Weight of sample: 100 year

Supplier Information

NT-MDT LLC

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Description

Supports more than 40 SPM measurement techniques, making it possible to obtain multifaceted information about the topography and physicochemical parameters of the sample. The open platform allows the instrument to operate in air, controlled environments and liquids.

Supports high-frequency operation modes (up to 5 MHz).

Support for non-resonant scanning techniques HYBRID 3.0

Support Dual Scan mode - scan area 200x200µm

Three-axis feedback control sensors

Built-in optical system with 1µm resolution

Specifications

XY scanning range, µm

100x100; 2x2

Scanning mode

Contact AFM; Semi-contact AFM; Jumping AFM; Scanning capacitance microscopy; Kelvin probe microscopy; Magnetic force microscopy; Electrostatic force microscopy

dimensions

400x250x450 mm

Weight of sample

100 year

Length of sample

Flat grinder, Specialised grinder mm

Scanning range Z, µm

Desktop placement

yes

Type of samples

prepared

Maximum operating temperature