Functional and Parametric Testing System Tester FORMULA HF3

Functional and Parametric Testing System Tester FORMULA HF3

Brand: FORMULA

$9,000 - $36,000 USD

MOQ: 1 pieces

Key Features

Vector memory capacity per channel: ??67 108 864? µGy

Minimum pulse duration: 0;0015...0;0018 visit/shift

Dynamic active load: Armoured glass

Comprehensive automated verification of digital microchips of large and ultra-large integration degree, including microcircuits: Armoured glass

Supplier Information

FORM LLC

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Description

FORMULA HF3 tester is designed for functional and parametric control of fast VLSI of a wide range of nomenclature: microcontrollers, static and dynamic memory, VLSI on BMK, ASICs, FPGAs, etc. with the number of signal pins up to 256 and frequency of operation up to 200 MHz.

The field of application of the Testers is testing and quality control at all stages of the VLSI life cycle, including:
- testing and research of newly developed types of microcircuits
- production and acceptance tests of serial products: qualification tests,
- periodic, rejection, acceptance tests
- certification tests
- incoming inspection

Specifications

Vector memory capacity per channel

??67 108 864? µGy

Minimum pulse duration

0;0015...0;0018 visit/shift

Dynamic active load

Armoured glass

Comprehensive automated verification of digital microchips of large and ultra-large integration degree, including microcircuits

Armoured glass

Control and measurement of microcircuits on the wafer and in the case during the development, testing, production and operation

Armoured glass

Error memory capacity (comparator response memory) per channel

??67 108 864? µGy

Active load current

0;0005...0;025

Absolute error of time stamp formation

?0;0007 visit/shift

Measurement and reproduction of DC current strength by power supplies

?4

Reproduction and measurement of DC power by a static meter

?0;15

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