Functional and Parametric Testing System for High-Speed Integrated Circuits FORMULA HF3M

Functional and Parametric Testing System for High-Speed Integrated Circuits FORMULA HF3M

Brand: FORMULA

$9,000 - $30,000 USD

MOQ: 1 pieces

Supplier Information

FORM LLC

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Description

FORMULA HF3M tester is designed for functional and parametric control of fast-acting VLSI of wide nomenclature: microcontrollers, static and dynamic memory, VLSI on BMK, ASICs, FPGAs, etc. with the number of signal pins up to 256 and frequency of operation up to 200 MHz.The field of application of Testers - testing and quality control at all stages of VLSI life cycle, including: testing and research of newly developed types of microcircuits production and acceptance testing of serial products: qualification, periodic, rejection, acceptance certification testing incoming inspection

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