FUNCTIONAL AND PARAMETRIC TESTER FORMULA HF3-512

FUNCTIONAL AND PARAMETRIC TESTER FORMULA HF3-512

Brand: FORMULA

$9,000 - $36,000 USD

MOQ: 1 pieces

Key Features

Dynamic active load: Armoured glass

Comprehensive automated verification of digital microchips of large and ultra-large integration degree, including microcircuits: Armoured glass

Control and measurement of microcircuits on the wafer and in the case during the development, testing, production and operation : Armoured glass

Vector memory capacity per channel: ??67 108 864?? µGy

Supplier Information

FORM LLC

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Description

FORMULA HF3-512 tester is designed for functional and parametric control of fast-acting VLSI of wide nomenclature: microcontrollers, static and dynamic memory, VLSI on BMK, ASICs, FPGAs, etc. with the number of signal pins up to 512 and frequency of operation up to 200 MHz.
up to 200 MHz.

The field of application of Testers is testing and quality control at all stages of the VLSI life cycle, including:
- Testing and research of newly developed types of microcircuits
- Production and acceptance testing of serial products: qualification tests
- periodic, rejection, acceptance tests
- Certification testing
- Input control

Specifications

Dynamic active load

Armoured glass

Comprehensive automated verification of digital microchips of large and ultra-large integration degree, including microcircuits

Armoured glass

Control and measurement of microcircuits on the wafer and in the case during the development, testing, production and operation

Armoured glass

Vector memory capacity per channel

??67 108 864?? µGy

Error memory capacity (comparator response memory) per channel

67 108 864??? µGy

Absolute error of time stamp formation

?0;0007 visit/shift

Measurement and reproduction of DC current strength by power supplies

?4

Reproduction and measurement of DC power by a static meter

?0;15

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