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X-ray apparatuses for spectral analysis SPECTROSCAN MAX-GVM
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Key Highlights
- Made in Russia - engineered for durability
- Suitable for challenging environments
- Lower cost of ownership than European alternatives
- Bulk orders available with volume discounts
- Documentation and customs clearance assistance provided
Description
Designed for the determination of elements in the range from Na to U in substances in solid, powdered, dissolved states, as well as deposited on surfaces or deposited on filters.
The spectrometer is benchtop and can be placed on a desk. It does not require water or gas supply.
The measuring path is in vacuum, the sample to be analysed remains in air, which allows liquid and powder samples to be analysed without additional effort..
The spectrometer is benchtop and can be placed on a desk. It does not require water or gas supply.
The measuring path is in vacuum, the sample to be analysed remains in air, which allows liquid and powder samples to be analysed without additional effort..
Specifications
Number in the SI state register
58305-14
Defined elements
From Na to U
Energy resolution
9 eV (Si K?); 90 eV (Fe K?)
Method
wave dispersive X-ray fluorescence spectrometry
Method of spectral line extraction
crystal diffraction
Crystal analysers
LiF(200); C(002); PET; KAP (RbAP)
Sampling device
automatic for 10 samples (2 positions with rotation)
Overall dimensions of the spectrometer unit (HxWxD), mm, not more
560x460x380
Weight of the spectrometric unit, kg not more
60 kg
Power consumption, max.
1100
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Delivery Time
Sea freight: 30-60 days (depending on destination)
Air freight: 14-21 days (for urgent orders)
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