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Test and measurement system FORMULA TT2 semiconductor tester
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FOB, CIF & EXW terms available
Key Highlights
- Made in Russia - engineered for durability
- Suitable for challenging environments
- Lower cost of ownership than European alternatives
- Bulk orders available with volume discounts
- Documentation and customs clearance assistance provided
Description
The FORMULA® TT2 tester is a universal test and measurement system designed for comprehensive automated testing of static parameters of semiconductor devices: field-effect and bipolar transistors, diodes, thyristors, stabilisers, optocouplers and micro assemblies.
The field of application of the Tester is testing and quality control at all stages of the semiconductor devices life cycle, including:
- Testing and research of newly developed types of semiconductor devices
- Production and acceptance tests of serial semiconductor products: type, qualification, periodic, rejection, acceptance and acceptance tests.
- Certification tests of EKB IP
- Input control
The field of application of the Tester is testing and quality control at all stages of the semiconductor devices life cycle, including:
- Testing and research of newly developed types of semiconductor devices
- Production and acceptance tests of serial semiconductor products: type, qualification, periodic, rejection, acceptance and acceptance tests.
- Certification tests of EKB IP
- Input control
Specifications
Measurement of DC current and voltage signals in the control of static parameters of semiconductor devices on the wafer and in t
Armoured glass
Availability of the option "Switchboard for thermal tests"
Armoured glass
Integration with probe dispensers, test equipment, external instruments via interfaces
gpib; rs-232; lan; handler
Number of Tester channels, each for setting and measuring parameters
2 pc
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Shipping Terms
Delivery Time
Sea freight: 30-60 days (depending on destination)
Air freight: 14-21 days (for urgent orders)
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