
RXI modular platform test and measurement system
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Key Highlights
- Made in Russia - engineered for durability
- Suitable for challenging environments
- Lower cost of ownership than European alternatives
- Bulk orders available with volume discounts
- Documentation and customs clearance assistance provided
Description
The RXI systems are designed for reproduction and measurement of DC electric voltage, DC electric force, time and derived from them quantities during testing of ICs of a wide nomenclature for compliance with the purpose indicators by methods of functional control and parametric measurements.
The principle of operation is based on methods of functional control and parametric measurements of digital and mixed-signal ICs, static and dynamic memory, as well as systems on a crystal, on a wafer and in a housing.
RXI systems are designed for complex automated measurement and control of parameters at all stages of the life cycle of ICs - during development, testing, production and incoming inspection, as well as during operation of electronic products for special and general industrial purposes.
RXI systems belong to the design-component devices of variable composition with architecture of modular type, providing for customised configuration of SIs.
The principle of operation is based on methods of functional control and parametric measurements of digital and mixed-signal ICs, static and dynamic memory, as well as systems on a crystal, on a wafer and in a housing.
RXI systems are designed for complex automated measurement and control of parameters at all stages of the life cycle of ICs - during development, testing, production and incoming inspection, as well as during operation of electronic products for special and general industrial purposes.
RXI systems belong to the design-component devices of variable composition with architecture of modular type, providing for customised configuration of SIs.
Specifications
Active Load DC Current Reproduction
0 to + 24 mA A
High, Medium and Low DC Voltage Reproduction by Drivers (IM PI Channel Electronics Units) 2403110:High, Medium and Low DC Voltag
-1.5...6.5 V
Limits of permissible absolute error of time of formation of marks T 1_ dat and T 2_ dat (IEPA IM PIN 400M)
±200 for positive voltage drop; ±250 for negative voltage drop
Absolute error tolerance limits of T 3 and T 4 tag generation time (OEPA IM PIN 400M)
±150 for positive voltage drop; ±250 for negative voltage drop
Absolute error tolerance limits of T 1_ dat and T 2_ dat generation time with respect to T 3 and T 4 marks (IOTA IM PIN 400M)
±400
Measurement of DC current in channel merging mode (IM DPS)
from - N -500 to +N -500 mA, where N is the number of combined channels A
Measuring module for reproduction of DC voltage steps with function of current limitation at a set level
availability
DC Voltage Reproduction (IM LNPS10 V)
-10...10 V
DC Voltage Playback and Measurement (IM DPS)
-2...7 V
Maximum baud rate (IM PIN 400M)
400
Measurement of DC Voltage (PPMU IM PIN 400M Channel Static Parameter Meter)
-1.5...7 V
DC Voltage Reproduction (IM PIN 400M PPMU Static Parameter Meter) 2403111:DC Voltage Reproduction (IM PIN 400M)
-1.5...7 V
DC Voltage Measurements (PMU IM PIN 400M Static Meter)
-2...8 V
FC Frequency Reproduction Range
9...200000
DC Voltage Playback (IM PIN 400M PMU Static Meter)
-2...8 V
High and Low Level DC Voltage Measurements by Comparators (IM PIN 400M Channel Electronics PMU)
-1...7 V
Note: All specifications are provided by the manufacturer and may be subject to change. Please contact us to confirm the latest specifications before placing your order.
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Delivery Time
Sea freight: 30-60 days (depending on destination)
Air freight: 14-21 days (for urgent orders)
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