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Spectroscopic X-ray Analyzers for Element Detection - SPEKTROSKAN MAX-GVM

Universal Composition Analysers

Manufacturer:SPECTRON LLC

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FOB, CIF & EXW terms available

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Description

Designed for the determination of elements in the range from Na to U in substances in solid, powdered, dissolved states, as well as deposited on surfaces or deposited on filters. The spectrometer is benchtop and can be placed on a desk. It does not require water or gas supply. The measuring path is in vacuum, the sample to be analysed remains in air, which allows liquid and powder samples to be analysed without additional effort..

Specifications

Number in the SI state register

58305-14

Defined elements

From Na to U

Energy resolution

9 eV (Si K?); 90 eV (Fe K?)

Method

wave dispersive X-ray fluorescence spectrometry

Method of spectral line extraction

crystal diffraction

Crystal analysers

LiF(200); C(002); PET; KAP (RbAP)

Sampling device

automatic for 10 samples (2 positions with rotation)

Overall dimensions of the spectrometer unit (HxWxD), mm, not more

560x460x380

Weight of the spectrometric unit, kg not more

60 kg

Power consumption, max.

1100

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Shipping Terms

FOB Novorossiysk, RussiaCIF Available to major ports worldwideEXW Manufacturer's facility, Russia

Delivery Time

Sea freight: 30-60 days (depending on destination) Air freight: 14-21 days (for urgent orders)

Payment Methods

Letter of Credit (L/C)Wire Transfer (T/T)Escrow Services

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Spectroscopic X-ray Analyzers for Element Detection - SPEKTROSKAN MAX-GVM

Description

Specifications

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