Microscope-nanoprofilometer interference MNP-1 KPBM.1224

MNP is designed for non-contact measurement of micro- and nano-relief of surfaces. It has 2 modes of operation: - "nano-measurement" for measuring the height of relief of surfaces of high class of purity with a resolution of less than 1 nm in the range from 0,01 to 50 microns. - "micro-measurement" is designed for measuring the height of relief of rough surfaces in the range from 0,001 to 5 mm with a resolution of less than 1 micron. Distinctive features: - Compactness, fast performance, resistance to external vibrations; - High degree of automation of the measurement process, including positioning of the measurement object by three coordinates; - Developed software user interface and high-quality graphical interface for working with multiplanar 3D-representations of measurement results; - Wide possibilities of TPL adjustment for different types of morphology of the measured surfaces; - Possibility of work in two-wave mode; - Possibility of measuring large areas by stitching the re