
FORMULA TT3 semiconductor tester test system
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FOB, CIF & EXW terms available
Key Highlights
- Made in Russia - engineered for durability
- Suitable for challenging environments
- Lower cost of ownership than European alternatives
- Bulk orders available with volume discounts
- Documentation and customs clearance assistance provided
Description
FORMULA TT3 tester is a universal test and measurement system designed for complex automated testing of static parameters of semiconductor devices: field and bipolar transistors, diodes, thyristors, stabilitrons, optrons, micro assemblies, as well as:
- Capacitance measurement: input capacitance, pass capacitance, output capacitance for field-effect transistors,
- Charge measurement: gate-to-drain, gate-to-drain and total charge for field-effect transistors,
- Measurement of passive components (L,C,R).
The field of application of the Testers is testing and quality control at all stages of the semiconductor devices life cycle, including:
- testing and research of newly developed types of semiconductor devices,
- production and acceptance tests of serial products: qualification,
- periodic, rejection, acceptance and acceptance tests,
- certification tests,
- incoming inspection.
- Capacitance measurement: input capacitance, pass capacitance, output capacitance for field-effect transistors,
- Charge measurement: gate-to-drain, gate-to-drain and total charge for field-effect transistors,
- Measurement of passive components (L,C,R).
The field of application of the Testers is testing and quality control at all stages of the semiconductor devices life cycle, including:
- testing and research of newly developed types of semiconductor devices,
- production and acceptance tests of serial products: qualification,
- periodic, rejection, acceptance and acceptance tests,
- certification tests,
- incoming inspection.
Specifications
Number of installation sites
1 pc
Integration with probe dispensers, test equipment, external instruments via interfaces
gpib; rs-232; lan; handler
Setting and measuring current range
-100...100 A
Range of set and measured voltages
180...2000 V
Measurement of DC current and voltage signals in the control of static parameters of semiconductor devices on the wafer and in t
Armoured glass
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Shipping Terms
Delivery Time
Sea freight: 30-60 days (depending on destination)
Air freight: 14-21 days (for urgent orders)
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