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Electric Thermal Training Complex for Integrated Circuits FORMULA BiS

Electric Thermal Training Complex for Integrated Circuits FORMULA BiS — FORM LLC

Brend: FORMULA
₼25,500 - ₼102,000 AZN
MOQ: 1 sets

Əsas xüsusiyyətlər

Reproducible temperature range: from 55 to 150 °C
Total time to reach the set thermal mode, taking into account temperature stabilization in the useful volume of the heat chamber: Flat grinder, Specialised grinder
Time to reach the limit values of the reproducible temperature, not more than: 60
Time of stabilization of the set temperature mode after reaching the reproducible temperature, not more than: 30

Bu brenddən daha çox FORMULA

Integrated Circuit Testing Complex for Digital ICs FORMULA BiS-2K

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FORMULA R Rele Testi Kontrol Ölçmə Sistemi

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Təsvir

The FORMULA BiS series electro-thermotracing (ETT) complexes are designed for testing integrated circuits (ICs) in accordance with the requirements of the operational process flow charts for the corresponding groups of ICs according to OST 11 073.013 2008 using the following methods:

- Electro-termination;

- Failure tests;

- Exposure to elevated temperature of the working environment.

The peculiarity of FORMULA BiS ETT complexes is the modular architecture, which allows to configure the test equipment in accordance with the Customer's tasks, both in terms of performance requirements and requirements to electrical modes.

FORMULA BiS is a modular type test system, which includes an Electronics Module and one or two Modules of a test chamber with thermal stabilisation system (CIT Module).

The photo shows the FORMULA BiS ETT System in configuration with two KIT Modules.

Spesifikasiyalar

Reproducible temperature range
from 55 to 150 °C
Total time to reach the set thermal mode, taking into account temperature stabilization in the useful volume of the heat chamber
Flat grinder, Specialised grinder
Time to reach the limit values of the reproducible temperature, not more than
60
Time of stabilization of the set temperature mode after reaching the reproducible temperature, not more than
30
Permissible temperature deviation in the useful volume of the chamber from the set point in steady state mode at temperatures up
± 3 °C
Permissible temperature deviation in the usable volume of the chamber from the setpoint in steady-state mode at temperatures fro
± 5 °C
Maximum temperature gradient in the working volume, max.
10 °C
Instability of steady-state temperature maintenance
±2 °C
Maximum number of load boards (test boards) placed in the test chamber of the KIT Module
32 pcs

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