
Testing station "ELBRUS-TEST"
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Key Highlights
- Made in Russia - engineered for durability
- Suitable for challenging environments
- Lower cost of ownership than European alternatives
- Bulk orders available with volume discounts
- Documentation and customs clearance assistance provided
Description
The Elbrus family of microchips has been developed in JSC "MCST" taking into account the high manufacturability of future products. The processors and CPUs (peripheral interface controllers) already have built-in tools for high-precision diagnostics of assembled boards in order to build defect-free production. The "ELBRUS-TEST" test kit uses these built-in tools and allows to accurately diagnose and localise the following types of defects on products using Elbrus chipsets:
Processor and DIMM linkages;
DIMM memory slot links to processors;
Links of DRAM chips (in case of soldered version of memory chips) to processors;
Links of processors and KPIs to their peripherals such as flash, various interface chips, etc.
Support for devices based on the following chips:
1991VG1YA (KPI)
1891VM018 (R2000)
1891VM12Ya (Elbrus 8CB)
1891VM028 (Elbrus 8C)
1891VM11YA (Elbrus 1C+)
1991VG2YA (KPI-2)
1891VM6YA (R1000)
1891VM8Ya (Elbrus 4C)
Processor and DIMM linkages;
DIMM memory slot links to processors;
Links of DRAM chips (in case of soldered version of memory chips) to processors;
Links of processors and KPIs to their peripherals such as flash, various interface chips, etc.
Support for devices based on the following chips:
1991VG1YA (KPI)
1891VM018 (R2000)
1891VM12Ya (Elbrus 8CB)
1891VM028 (Elbrus 8C)
1891VM11YA (Elbrus 1C+)
1991VG2YA (KPI-2)
1891VM6YA (R1000)
1891VM8Ya (Elbrus 4C)
Specifications
Peripheral scanning standard
JTAG IEEE 1149.1-6
TAP port frequency
40
Interface
USB 2.0, Ethernet and Firewire
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