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Interferometric Control Profilometer PIKA-1M for High-Order Surface Measurement
Manufacturer:
OPTICS OJSC
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Description
Profilometer interference control device for controlling the shape of spherical and aspherical surfaces of the second and higher orders PIKA-1M
Specifications
Assignment
for shape control of spherical and aspherical surfaces of the second and higher orders
Type
Interference control device
Mark
PEAK-1M
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Delivery Time
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Air freight: 14-21 days (for urgent orders)
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