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Nanosecond Impulse Interference Test Generator IGN 4.1M for Technical Equipment Testing
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FOB, CIF & EXW terms available
Description
Generator is designed to create normalised packs of nanosecond pulse interference (NIP) in the power supply network and signal circuits during testing of technical means (hereinafter - TS), which can be exposed to NIP according to GOST 30804.4.4-2013 p. 6.1, p. 6.3, GOST IEC 61000-4-4-2016.The generator is supplied with an inbuilt communication-decoupling device (CDD) designed for introduction of NIPs into single-phase AC power supply circuits with voltage 220V and current consumption up to 10A.
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