Laser Microscope with Long-Travel Stage MIM-340 for Non-Destructive Nanostructure Research

A PC-controlled device designed for non-contact non-destructive investigations of submicron structures with nanometre resolution in the field of materials science and their location on the scale of the entire material science sample with nanometre accuracy. It is a powerful tool for a wide range of applications in electronics, materials science, optical manufacturing, metrology, and biomedical research